| Abstract Detail
Breeding and Genetics Yang, Jiliang [1], Beasley, D. [1], Chen, Qin [1]. Comparison of three testing methods for high-throughput disease evaluation of potato late blight. LATE blight, caused by Phytophthora infestans (Mont.) de Bay is a major disease of potato and tomato. Breeding for general resistance of potato to late blight has been extensive. However, due to quantitative nature of general resistance of potato late blight, it is not easily evaluated as specific resistance. Reliable phenotypic evaluation of late blight resistance is important for breeding and marker developing programs. Development of a quick, space effective and accurate method for evaluation of late blight resistance are very important in screening resistance potato clones, genetic analysis, molecular markers and breeding for resistant cultivars. In this study, three artificial inoculation methods were systemically compared for evaluating potato plants resistant to late blight, including detached leaf assay (DL), tissue culture plantlet assay (TCP) and whole plantlet tray assay (WPT). The results showed that two methods, DL and the WPT tests resulted in phenotyping scorings that were in a good agreement each other for the same plants, but most potato clones, somehow were prone to be susceptible in the TCP test. Furthermore, the DL method, as a reliable and easy operating method, was used for evaluating more than 1500 individuals in our potato molecular genetic program. The phenotyping of the population by the DL method was fully agreed with the genotyping obtained from analysis of markers that flank late blight resistance genes. So the well established detached leaf assay can be used as an on hand tool for high throughput investigation of the qualitative interaction between potato and late blight pathogen.
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1 - AAFC - Lethbridge Research Centre, P.O. Box 3000, Lethbridge, AB, T1J 4B1, CANADA
Keywords:
Late Blight
disease resistance screening.
Session: Poster-39
Location: Ballroom CD/Monona Terrace
Date: Tuesday, July 25th, 2006
Time: 8:00 AM
Abstract ID:383 |
